AFM Tips, Probes and Cantilevers - Nanotechology pages
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AFM Tips, Probes and Cantilevers - Nanotechology pages
Top articles and sources regarding nanotechnology, atomic force microscope technology, AFM tips, probes and cantilevers
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Triaxial AFM Probes for Noncontact Trapping and Manipulation

Triaxial AFM Probes for Noncontact Trapping and Manipulation http://t.co/ftF6CYCW #fas...

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IBM Pushes Atomic Force Microscopy to Its Limits

IBM Pushes Atomic Force Microscopy to Its Limits | AFM Tips, Probes and Cantilevers - Nanotechology pages | Scoop.it

While IBM’s noncontact AFM had shown the ability to image hydrogen atoms previously, this latest research made that capability more concrete, according to Leo Gross, Scientist, at IBM Research Zurich.

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Microscopy Market- Global Industry Size, Market Share, Trends, Analysis And Forecasts 2012-2018

Microscopy market is witnessing double digit growth rate due to an increase in funding from government and corporate world for research in life sciences and nanotechnology. Moreover, advancement in technology has resulted in ease of usage, better quality imaging, automation, and faster analysis, making a huge positive impact on the global market.

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AFM Tips Classification

AFM Tips Classification | AFM Tips, Probes and Cantilevers - Nanotechology pages | Scoop.it

AFM tip classification by type and size for any application.

 

Content:

AFM Tips by Shape
AFM Tips by Material
AFM Tips by Coating

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Gone fishing: Researchers' imaging technique trolls in quiet cellular seas

Gone fishing: Researchers' imaging technique trolls in quiet cellular seas | AFM Tips, Probes and Cantilevers - Nanotechology pages | Scoop.it

Professor Min-Feng Yu’s group developed “trolling AFM,” a method for high-quality imaging of soft cells and tissues at atomic resolution.

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AFM Probes Sources

AFM Probes Sources | AFM Tips, Probes and Cantilevers - Nanotechology pages | Scoop.it

A source for the major brands of AFM cantilevers, calibration gratings, 
and other products for SPM.  Independent expert advice, best price and prompt delivery from stock.

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Not-so-precious: Stripping gold from AFM probes allows better measurement of picoscale forces

Not-so-precious: Stripping gold from AFM probes allows better measurement of picoscale forces | AFM Tips, Probes and Cantilevers - Nanotechology pages | Scoop.it

JILA researchers found that removing an AFM probe's gold coating—until now considered helpful—greatly improved force measurements performed in a liquid, the medium favored for biophysical studies such as stretching DNA or unfolding proteins. As described in Nano Letters,* stripping the gold from the diving-board-shaped probe, or cantilever, with a brief chemical bath improved the precision and stability of force measurements about 10-fold.

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Bruker Launch Turnkey EC-AFM Solution for Lithium Battery Research

Bruker Launch Turnkey EC-AFM Solution for Lithium Battery Research | AFM Tips, Probes and Cantilevers - Nanotechology pages | Scoop.it
Bruker today announced the release of the first turnkey solution for Li battery electrochemical atomic force microscopy (EC-AFM) research. The new EC-AFM accessory adds a sealed electrochemical cell specifically designed for battery research and turn-key 1ppm environmental control to the industry-leading Dimension Icon AFM platform to enable long-term in situ studies of Li battery electrodes.
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AFM cantilever classification

AFM cantilever classification | AFM Tips, Probes and Cantilevers - Nanotechology pages | Scoop.it

AFM cantilever classification by type and size for any application.

 

Content:

AFM Cantilevers by Shape
AFM Cantilevers by Material
AFM Cantilevers by Number of Cantilevers per AFM Probe
AFM Cantilevers by Coating
Interdependence between AFM Cantilever Geometry and Application Mode
Resonance Frequency and Force Constants of AFM Cantilevers
Calculator for the Resonance Frequency and the Force Constants of AFM cantilevers

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SEM image of the week: AFM probe tips

SEM image of the week: AFM probe tips | AFM Tips, Probes and Cantilevers - Nanotechology pages | Scoop.it

Probe tips are used in the Atomic Force Microscope (AFM) to detect the surface topography of small objects. A probe is made up of three parts. The substrate is the base of the probe and is the most visible part.

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